Dong Yan
Sr. Development Engineer. (FIB)

Education:

Ph. D in Automatic Control Systems and Engineering: June 1995
Beijing University of Aeronautics and Astronautics, Beijing, China
Master of Engineering, Automatic Control Systems and Engineering: April 1992
B.S. in Applied Mathematics: July 1989

Dong Yan possess more than 11 years experience in NEMS/MEMS and semiconductor product development and fabrication at international Nanosciences and Nanoengineering labs and centers.

Before joining CNSE, Dong worked at the School of Electrical and Computer Engineering, Cornell University, and spent almost five years on processing and manufacturing at Cornell NanoScale Science and Technology Facility (CNF). At Cornell Dong conducted research on radio isotope micro-power sources, infrared imagers, and infrared scene generator projects funded by DARPA.

Dong’s expertise is in tool operation and process optimization, integration and development, and is experienced at developing new processes for a specific fabrication objective.

Research Interests:

Development of high speed interconnects with integrated photonics and VLSI chips, optical NEMS/MEMS devices, Micro-fluidic devices, Bio-MEMS sensors and devices, inertial MEMS sensors, NEMS/MEMS processing technologies and nanoscale metrologies and characterization technologies.