IEEE EDS UCR  welcome to IEEE EDS at UCR

31st EOS/ESD Symposium and Exhibition Visit

Conducting real ESD device level testing using VF-TLP at the exhibition

Exhibition held at Disney Hotel, why not take a photo with Mickey~

All Participants (L-1:Prof. Albert Wang; L-2: Prof. Juin J. Liou; L-3: Mr. Jon Barth)